Tag Archives: SEM

JEOL Introduces New Extended Pressure, High Resolution SEM

JEOL, the well known manufacturer of electron microscopes and instrumentation as recently introduced a new Scanning Electron Microscope (SEM). The new JSM-IT300LV tungsten low vacuum SEM shares the goodness of the company’s award winning InTouchScope analytical SEM platform, on which it is built and JSM-6610LV analytical SEM. The new JEOL JSM-IT300LV has a resolution of […]

Nanosuit to Keep Insects Alive in Vacuum

Scanning Electron Microscopy is one of the most important analytical methods widely for studying the surface topography and composition of a variety of samples including metals, geological and biological specimens. The highly magnified hi-res images obtained from SEMs are useful for detailed study of morphology and specimens which may include insects, tissue and cell samples […]