Agilent’s new 7500 AFM features the company’s patented top-down tip scanner technology, making it capable of imaging samples in air, fluids and under controlled temperature and environmental conditions. The presence of an integrated environmental chamber in the equipment provides a sealed sample compartment isolated from rest of the system, which along with an array of ports and sensors offers control over the environment and temperature inside the system. The AFM’s scanner comes with a standard nose cone for use in contact, AAC, CS-AFM, EFM, KFM, MFM and MAC modes. The standard cone can be easily replaced for other additional AFM techniques. Agilent 7500 AFM is also capable of advanced imaging and electrochemistry applications.
The functions of Agilent 7500 AFM are controlled by the company’s easy to use, intuitive and flexible PicoView software. In addition to PicoView, the company’s Pico Image software extends the device’s post processing capabilities and helps build surface analysis reports using multi-layer measurement data. Agilent 7500 AFM finds its use in material science, life science, polymer science, electrochemistry, nanolithography and other applications.